Burn In Socket

  • Damage Free on the Device ball and PCB pad
  • High-speed testing implementation
  • 0.25P Solution available
  • Long service life and high durability
  • Customized and optimized solution
Test state
Test state
Latch open
Latch open

Exploded View

㈜티에프이 / 본사

경기도 화성시 병점구 반월길 50-8 (우 : 18384)

289-1 Yaenda, Hidaka City, Saitama, Japan (日 : 〒350-1236 埼玉県日高市猿田289-1)


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